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P.O. Box 725

Milan, TN 38358

(731) 695-1562     Fax (731)723-5445


Overview

Useful Acronyms

Services

Industry Expertise

Device Expertise

 
ASAP As Soon As Possible
BP Boiling Point
BTU British Thermal Unit
CAD Computer Aided Drafting/ Computer Aided Design
CAE Computer Assisted Engineering
CAM Computer Assisted Manufacturing
CAN Control Area Network
CCD Charge Coupled Device
CMOS Complimentary Metal Oxide Semiconductor
CRT Cathode Ray Tube
CSE Control Systems Engineer
D/A Digital/Analog
DC Direct Current
DCS Distributed Control System
DDC Direct Digital Control
DLS Dynamic Light Scattering
DMA Direct Memory Access
DOS Disk Operating System
ECD Electron Capture Detector
ECP Enhanced Capabilities Port (parallel)
EPROM Electrically Programmable Read Only Memory
EEPROM Electrically Eraseable Programmable Read Only Memory
EID Electron Ionization Detector
ESIA Extended Industry Standard Architecture
EPP Enhanced Parallel Port (parallel port)
FAB Fast Atom Bombardment
FDDI Fiber Distributed Data Interface
FDMA Frequency Division Multiple Access
FET Field Effect Transistor
FIA Flow Injection Analysis
FID Flame Ionization Detector
FIP Factory Information Protocol
FP Flash Point
FSK Frequency Shift Keying
FTTA Federal Technology Transfer Act
GC Gas Chromatography
GD Glow Discharge
GF Graphite Furnace
GIPOF Graded Index Plastic Optical Fiber
GUI Graphic User Interface
HART Hiway Addressable Remote Terminal
HAZOPS Hazard and Operability Study
HEPT Height Equivalent of a Theoretical Plate
HMI Human Machine Interface
HRF Hazard Reduction Factor
HTG Hydrostatic Tank Gauging
ICCD Intensified Charge Coupled Device
ICP Inductively Coupled Plasma
IEF Iso-Electric Focusing
IR Infrared
ISA Industry Standard Architecture
ISE Ion Selective Electrode
ISFET Ion Selective Field Effect Transistor
ITPS International Practical Temperature Scale
LALLS Low Angle Laser Light Scattering
LC Liquid Chromatography
LCD Liquid Crystal Display
LED Light Emitting Diode
LIDAR Light Detection and Ranging
LIESA Laser Induced Emission Spectral Analysis
LOD Limits Of Detection
Ma Milliampere
MOS Metal Oxide Semiconductor
MS Mass Spectroscopy
MSD Mass Selective Detector
MSDS Material Safety Data Sheet
MTBF Mean Time Between Failures
MTTR Mean Time to Repair
Mv Millivolt
NAT Network Address Translator
NDIR Non Dispersive Infrared
NEC National Electric Code
NIR Near Infrared
NMR Nuclear Magnetic Resonance
NPD Nitrogen Phosphorous Detector
OES Optical Emission Spectroscopy
PAD Photodiode Array Detector
PAI Process Analysis Instrumentation
PC Personal Computer
PCI Peripheral Component Interconnect
PCMIA Personal Computer Memory Card International Association
PEL Potential Exposure Limits
PID Proportional Integral Derivative
PLC Programmable Logic Controller
PM Preventative Maintenance
PPP Point to Point Protocol
PROFIBUS Process Fieldbus
PSD Particle Size Distribution
PV Process Variable
QA Quality Assurance
RFDC Radio Frequency Data Communications
RISC Reduced Instruction Set Chip
RTU Remote Thermal Unit
SAW Standing Acoustic Wave
SCADA Supervisory Control and Data Acquisition
SCR Silicon Controlled Rectifier
SCSI Small Computer Standard Interface
SD Standard Deviation
SDF Structured Data File
SECS Semiconductor Equipment Communications Standard
SIT Silicon Intensified Target
SLIP Serial Line Interface Protocol
SP Set Point
TCA Total Carbon Analyzer
TDD Time Division Duplex
TDMA Time Division Multiple Access
TILS Total Intensity Light Scattering
TLM Triple Modular Redundancy
TWA Time Weighted Average
UV UltraViolet
VFD Variable Frequency Drive
WYSIWYG What You See Is What You Get
XFMR Transformer
XRF X-Ray Flourescence

 

 

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